Showing posts with label imaging. Show all posts
Showing posts with label imaging. Show all posts

Thursday, May 5, 2011

Introduction to Functional Magnetic Resonance Imaging: Principles and Techniques

Introduction to Functional Magnetic Resonance Imaging: Principles and Techniques Review


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Introduction to Functional Magnetic Resonance Imaging: Principles and Techniques Feature

Functional Magnetic Resonance Imaging (fMRI) has become a standard tool for mapping the working brain's activation patterns, both in health and in disease. It is an interdisciplinary field and crosses the borders of neuroscience, psychology, psychiatry, radiology, mathematics, physics and engineering. Developments in techniques, procedures and our understanding of this field are expanding rapidly. In this second edition of Introduction to Functional Magnetic Resonance Imaging, Richard Buxton - a leading authority on fMRI - provides an invaluable guide to how fMRI works, from introducing the basic ideas and principles to the underlying physics and physiology. He covers the relationship between fMRI and other imaging techniques and includes a guide to the statistical analysis of fMRI data. This book will be useful both to the experienced radiographer, and the clinician or researcher with no previous knowledge of the technology.


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Tuesday, May 3, 2011

Aberration-corrected Imaging in Transmission Electron Microscopy: An Introduction

Aberration-corrected Imaging in Transmission Electron Microscopy: An Introduction Review


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Aberration-corrected Imaging in Transmission Electron Microscopy: An Introduction Feature

This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction.

The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.


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Wednesday, March 9, 2011

Mathematics of Multidimensional Seismic Imaging, Migration, and Inversion (Interdisciplinary Applied Mathematics, V. 13.)

Mathematics of Multidimensional Seismic Imaging, Migration, and Inversion (Interdisciplinary Applied Mathematics, V. 13.) Review


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Mathematics of Multidimensional Seismic Imaging, Migration, and Inversion (Interdisciplinary Applied Mathematics, V. 13.) Feature

For more than 80 years, the oil and gas industry has used seismic methods to construct images and determine physical characteristics of rocks that can yield information about oil and gas bearing structures in the earth. This book presents the different seismic data processing methods, also known as seismic "migration," in a unified mathematical way. The book serves as a bridge between the applied math and geophysics communities by presenting geophysicists with a practical introduction to advanced engineering mathematics, while presenting mathematicians with a window into the world of the mathematically sophisticated geophysicist.


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